REAL-EOD

Ellipsometric and channeling studies on ion-implanted silicon

Lohner, Tivadar (1980) Ellipsometric and channeling studies on ion-implanted silicon. KFKI Reports (80-64). MTA KFKI.

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Item Type: Book
Additional Information: 000063040 KFKI-80-64 International Conference on Ion Beam Modification of Materials Albany, N.Y., USA 1980, July 14-18
Subjects: Q Science / természettudomány > QC Physics / fizika
Depositing User: ALEPH SWORD
Date Deposited: 25 Nov 2018 06:29
Last Modified: 25 Nov 2018 06:29
URI: http://real-eod.mtak.hu/id/eprint/7287

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